THz-wave phase shift measurement by THz-wave interferometer

Y. Yamanaka; G. Sakano; J. Haruki; K. Kato

doi:10.1049/el.2017.0530

THz-wave phase shift measurement by THz-wave interferometer

Y. Yamanaka, G. Sakano, J. Haruki, K. Kato

集積電子システム

研究成果: Contribution to journal › Article

抜粋

A terahertz (THz)-wave interferometer was devised for measurement of the THz-wave phase shift. In this measurement system, the relative phase shift is deduced from the interference between the THz waves generated by two photomixers. Experimental results with this interferometer revealed that the semiconductor phase modulator could be used as a THz-wave phase shifter by utilising its chromatic dispersion.

元の言語	英語
ページ（範囲）	868-869
ページ数	2
ジャーナル	Electronics Letters
巻	53
発行部数	13
DOI	https://doi.org/10.1049/el.2017.0530
出版物ステータス	出版済み - 6 22 2017

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

文献にアクセス

10.1049/el.2017.0530

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これを引用

Yamanaka, Y., Sakano, G., Haruki, J., & Kato, K. (2017). THz-wave phase shift measurement by THz-wave interferometer. Electronics Letters, 53(13), 868-869. https://doi.org/10.1049/el.2017.0530

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