THz-wave phase shift measurement by THz-wave interferometer

Y. Yamanaka, G. Sakano, J. Haruki, K. Kato

研究成果: ジャーナルへの寄稿 › 記事

抄録

A terahertz (THz)-wave interferometer was devised for measurement of the THz-wave phase shift. In this measurement system, the relative phase shift is deduced from the interference between the THz waves generated by two photomixers. Experimental results with this interferometer revealed that the semiconductor phase modulator could be used as a THz-wave phase shifter by utilising its chromatic dispersion.

元の言語英語
ページ（範囲）868-869
ページ数2
ジャーナルElectronics Letters
巻53
発行部数13
DOI
出版物ステータス出版済み - 6 22 2017

Fingerprint

Terahertz waves
Phase shift
Interferometers
Chromatic dispersion
Phase shifters
Modulators
Semiconductor materials

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

これを引用

THz-wave phase shift measurement by THz-wave interferometer. / Yamanaka, Y.; Sakano, G.; Haruki, J.; Kato, K.

：: Electronics Letters, 巻 53, 番号 13, 22.06.2017, p. 868-869.

研究成果: ジャーナルへの寄稿 › 記事

Yamanaka, Y, Sakano, G, Haruki, J & Kato, K 2017, 'THz-wave phase shift measurement by THz-wave interferometer', Electronics Letters, 巻. 53, 番号 13, pp. 868-869. https://doi.org/10.1049/el.2017.0530
Yamanaka Y, Sakano G, Haruki J, Kato K. THz-wave phase shift measurement by THz-wave interferometer. Electronics Letters. 2017 6 22;53(13):868-869. https://doi.org/10.1049/el.2017.0530
Yamanaka, Y. ; Sakano, G. ; Haruki, J. ; Kato, K. / THz-wave phase shift measurement by THz-wave interferometer. ：: Electronics Letters. 2017 ; 巻 53, 番号 13. pp. 868-869.
@article{b1c0825f8ad34bb7af54ef88b82d29a5,
title = "THz-wave phase shift measurement by THz-wave interferometer",
abstract = "A terahertz (THz)-wave interferometer was devised for measurement of the THz-wave phase shift. In this measurement system, the relative phase shift is deduced from the interference between the THz waves generated by two photomixers. Experimental results with this interferometer revealed that the semiconductor phase modulator could be used as a THz-wave phase shifter by utilising its chromatic dispersion.",
author = "Y. Yamanaka and G. Sakano and J. Haruki and K. Kato",
year = "2017",
month = "6",
day = "22",
doi = "10.1049/el.2017.0530",
language = "English",
volume = "53",
pages = "868--869",
journal = "Electronics Letters",
issn = "0013-5194",
publisher = "Institution of Engineering and Technology",
number = "13",

}

TY - JOUR

T1 - THz-wave phase shift measurement by THz-wave interferometer

AU - Yamanaka, Y.

AU - Sakano, G.

AU - Haruki, J.

AU - Kato, K.

PY - 2017/6/22

Y1 - 2017/6/22

N2 - A terahertz (THz)-wave interferometer was devised for measurement of the THz-wave phase shift. In this measurement system, the relative phase shift is deduced from the interference between the THz waves generated by two photomixers. Experimental results with this interferometer revealed that the semiconductor phase modulator could be used as a THz-wave phase shifter by utilising its chromatic dispersion.

AB - A terahertz (THz)-wave interferometer was devised for measurement of the THz-wave phase shift. In this measurement system, the relative phase shift is deduced from the interference between the THz waves generated by two photomixers. Experimental results with this interferometer revealed that the semiconductor phase modulator could be used as a THz-wave phase shifter by utilising its chromatic dispersion.

UR - http://www.scopus.com/inward/record.url?scp=85021255295&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85021255295&partnerID=8YFLogxK

U2 - 10.1049/el.2017.0530

DO - 10.1049/el.2017.0530

M3 - Article

AN - SCOPUS:85021255295

VL - 53

SP - 868

EP - 869

JO - Electronics Letters

JF - Electronics Letters

SN - 0013-5194

IS - 13

ER -

文献にアクセス