抄録
A terahertz (THz)-wave interferometer was devised for measurement of the THz-wave phase shift. In this measurement system, the relative phase shift is deduced from the interference between the THz waves generated by two photomixers. Experimental results with this interferometer revealed that the semiconductor phase modulator could be used as a THz-wave phase shifter by utilising its chromatic dispersion.
本文言語 | 英語 |
---|---|
ページ(範囲) | 868-869 |
ページ数 | 2 |
ジャーナル | Electronics Letters |
巻 | 53 |
号 | 13 |
DOI | |
出版ステータス | 出版済み - 6月 22 2017 |
!!!All Science Journal Classification (ASJC) codes
- 電子工学および電気工学