Transmission electron microscopy of bulk specimens over 10μm in thickness

Sunao Sadamatsu, Masaki Tanaka, Kenji Higashida, Syo Matsumura

研究成果: Contribution to journalArticle査読

11 被引用数 (Scopus)


We succeeded the observation of microstructures in bulk-sized specimens of over 10. μm in thickness by employing a technique that combines transmission electron microscopy (TEM) with energy-filtered imaging based on electron energy-loss spectroscopy (EELS). This method is unique in that it incorporates the inelastically scattered electrons into the imaging process. Using this technique, bright and sharp images of dislocations in crystalline silicon specimens as thick as 10. μm were obtained. A calibration curve to determine foil thickness of such a thick specimen was also derived. This method simply extends the observable thickness range in TEM. If combined with tilt series of observation over a significant range of angle, it will disclose three dimensional nanostructures in a μm-order block of a specimen, promoting our understanding of the controlling mechanisms behind various bulky material properties.

出版ステータス出版済み - 3 1 2016

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学
  • 器械工学


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