This article reports our recent studies on the magnetic imaging by electron holography or Lorentz microscopy, which is combined with other supplementary techniques related to transmission electron microscopy (TEM). By combining with dark-field imaging, the "one-to-one correspondence" between the magnetic domain walls and antiphase boundaries (APBs) in a ferromagnetic shape memory alloy (SMA) Ni2Mn(Al,Ga) was revealed. In order to examine both magnetism and conductivity in a nanoscale area, we have developed a double probe piezodriving holder, by which microprobes can be brought in contact with the portion of interest. The conductivity measurement can be simultaneously performed with Lorentz microscopy or electron holography.
|ジャーナル||Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science|
|出版ステータス||出版済み - 4 2007|
All Science Journal Classification (ASJC) codes