Transmission electron microscopy studies of YBCO films fabricated by advanced TFA-MOD process

K. Yamada, N. Mori, K. Tada, T. Tanaka, R. Teranishi, M. Mukaida, S. Toh, K. Kaneko, T. Izumi, Y. Shiohara

    研究成果: ジャーナルへの寄稿学術誌査読

    1 被引用数 (Scopus)

    抄録

    The advanced metal organic deposition using trifluoroacetates (TFA-MOD) is one of the most promising methods for producing superconducting coated conductors. In order to form highly grain aligned YBa2Cu3O7-δ (Y123) films with high JC, it is important to control the microstructures of the films. In the present work, Y123 films were grown by the advanced TFA-MOD method on CeO2 layered LaAlO3 (LAO) substrates. Quenched films were prepared by cooling rapidly during the crystallization stage, and their cross-sectional microstructures were investigated by transmission electron microscopy (TEM). The bright-field images (BFIs) showed existence of some grains, precipitates and their interfaces in the film. Selected area electron diffraction patterns (SAEDPs) were taken from various regions, and a-axis and/or c-axis-oriented structures, amorphous structures, etc. were observed. In addition, Y123 grains, BaF2, CuO and Y2Cu2O5 grains were clarified by the scanning transmission electron microscopy-energy dispersive X-ray spectroscopy (STEM-EDS) analyses.

    本文言語英語
    ページ(範囲)717-721
    ページ数5
    ジャーナルPhysica C: Superconductivity and its applications
    463-465
    SUPPL.
    DOI
    出版ステータス出版済み - 10月 1 2007

    !!!All Science Journal Classification (ASJC) codes

    • 電子材料、光学材料、および磁性材料
    • 凝縮系物理学
    • エネルギー工学および電力技術
    • 電子工学および電気工学

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