Transmission electron microscopy studies of YBCO films fabricated by advanced TFA-MOD process

K. Yamada, N. Mori, K. Tada, T. Tanaka, R. Teranishi, M. Mukaida, S. Toh, K. Kaneko, T. Izumi, Y. Shiohara

研究成果: Contribution to journalArticle査読

1 被引用数 (Scopus)

抄録

The advanced metal organic deposition using trifluoroacetates (TFA-MOD) is one of the most promising methods for producing superconducting coated conductors. In order to form highly grain aligned YBa2Cu3O7-δ (Y123) films with high JC, it is important to control the microstructures of the films. In the present work, Y123 films were grown by the advanced TFA-MOD method on CeO2 layered LaAlO3 (LAO) substrates. Quenched films were prepared by cooling rapidly during the crystallization stage, and their cross-sectional microstructures were investigated by transmission electron microscopy (TEM). The bright-field images (BFIs) showed existence of some grains, precipitates and their interfaces in the film. Selected area electron diffraction patterns (SAEDPs) were taken from various regions, and a-axis and/or c-axis-oriented structures, amorphous structures, etc. were observed. In addition, Y123 grains, BaF2, CuO and Y2Cu2O5 grains were clarified by the scanning transmission electron microscopy-energy dispersive X-ray spectroscopy (STEM-EDS) analyses.

本文言語英語
ページ(範囲)717-721
ページ数5
ジャーナルPhysica C: Superconductivity and its applications
463-465
SUPPL.
DOI
出版ステータス出版済み - 10 1 2007

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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