Transport anisotropy of in-plane c-axis aligned a-axis oriented YBa2Cu3Ox thin films

M. Mukaida, S. Miyazawa

研究成果: ジャーナルへの寄稿学術誌査読

2 被引用数 (Scopus)

抄録

The temperature dependence of resistivity, ρ{variant}b and ρ{variant}c, is measured for a perfectly in-plane c-axis aligned a-axis oriented YBa2Cu3Ox thin film. In-plane alignment of the film is confirmed by X-ray ø-scan (in-plane rotation) diffraction and reflection high-energy electron diffraction (RHEED) measurements. X-ray ø-scan measurements and RHEED patterns reveal that the thin film has a twofold symmetry with no 90° domains, showing the c-axis for the film is aligned in-plane. Resistivity-temperature curves for both c- and b-directions show metallic behavior with a TC of 90.5 K. Resistivity in the c-axis direction at 290 K is 5.5 mΩcm, which is about eleven times larger than that of 500 μmΩcm for the b-axis direction. The resistivity anisotropy is in the same order as the coherence length. The temperature differential of normalized resistivity, d(ρ{variant}(T)/ρ{variant}(300))/dT, in the b-axis direction (2.8x10-3/K) is 2.5 times larger than that in the c-axis direction (1.1x10-3/K). This result clearly shows that the carrier transport in the b-axis direction is more metallic than that in the c-axis direction.

本文言語英語
ページ(範囲)2311-2312
ページ数2
ジャーナルPhysica B: Physics of Condensed Matter
194-196
PART 2
DOI
出版ステータス出版済み - 2月 2 1994
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学

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