Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopy

Dmitry Tyutyunnikov, Masatoshi Mitsuhara, Christoph T. Koch

研究成果: Contribution to journalArticle査読

抄録

In this paper we introduce an approach for precise orientation mapping of crystalline specimens by means of transmission electron microscopy. We show that local orientation values can be reconstructed from experimental dark-field image data acquired at different specimen tilts and multiple Bragg reflections. By using the suggested method it is also possible to determine the orientation of the tilt axis with respect to the image or diffraction pattern. The method has been implemented to automatically acquire the necessary data and then map crystal orientation for a given region of interest. We have applied this technique to a specimen prepared from a Ni-based super-alloy CMSX-4. The functionality and limitations of our method are discussed and compared to those of other techniques available.

本文言語英語
ページ(範囲)26-33
ページ数8
ジャーナルUltramicroscopy
159
P1
DOI
出版ステータス出版済み - 12 1 2015

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学
  • 器械工学

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