Ultrafast optical signal measurement using optoelectronic techniques

M. Yaita, T. Nagatsuma, K. Kato, K. Noguchi, H. Miyazawa, T. Otsuji

研究成果: Contribution to journalArticle査読

2 被引用数 (Scopus)

抄録

A novel ultrafast optical signal measurement technique is proposed that uses a fast photodetector and electrooptic (EO) sampling. The technique can satisfy three requirements for the measurement: large bandwidth, high sensitivity, and polarization independence. The measurement systems are demonstrated using two kinds of EO sampling configurations. One system uses direct EO sampling. It affords a larger bandwidth. The system can discern 100-Gbit s-1 return-to-zero (RZ) optical pulse-pattern signals with an on-off ratio of 22 dB. The other system uses a waveguide intensity modulator in EO sampling. It affords higher sesitivity and can measure an 80-Gbit s-1 RZ optical eye diagram. It is theoretically expected that the sensitivity of our system is higher than that of the all-optical technique.

本文言語英語
ページ(範囲)1119-1133
ページ数15
ジャーナルOptical and Quantum Electronics
30
11-12
出版ステータス出版済み - 12 1 1998
外部発表はい

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学
  • 電子工学および電気工学

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