### 抜粋

Technical debt refers to the phenomena of taking a shortcut to achieve short term development gain at the cost of increased maintenance effort in the future. The concept of debt, in particular, the cost of debt has not been widely studied. Therefore, the goal of this paper is to determine ways to measure the 'interest' on the debt and use these measures to see how much of the technical debt incurs positive interest, i.e., debt that indeed costs more to pay off in the future. To measure interest, we use the LOC and Fan-In measures. We perform a case study on the Apache JMeter project and find that approximately 42-44% of the technical debt incurs positive interest.

元の言語 | 英語 |
---|---|

ページ（範囲） | 68-71 |

ページ数 | 4 |

ジャーナル | CEUR Workshop Proceedings |

巻 | 1771 |

出版物ステータス | 出版済み - 1 1 2016 |

イベント | Joint of the 4th International Workshop on Quantitative Approaches to Software Quality, QuASoQ 2016 and 1st International Workshop on Technical Debt Analytics, TDA 2016 - Hamilton, ニュージ―ランド 継続期間: 12 6 2016 → … |

### All Science Journal Classification (ASJC) codes

- Computer Science(all)

## フィンガープリント Using analytics to quantify the interest of self-admitted technical debt' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

## これを引用

*CEUR Workshop Proceedings*,

*1771*, 68-71.