Validation of nuclear reaction models relevant to cosmic-ray neutron induced single-event effects in microelectronics

Shin Ichiro Abe, Yukinobu Watanabe, Shusuke Hirayama, Nobuyuki Sano, Yoshiharu Tosaka, Masafumi Tsutsui, Hiroshi Furuta, Takeshi Imamura

研究成果: Contribution to journalConference article査読

7 被引用数 (Scopus)

抄録

The accuracy of nuclear reaction models used in the PHITS (Particle and Heavy Ion Transport code System) code, i.e., the INC model, the QMD model and the event generator mode (e-mode) with the evaluated nuclear data library JENDL-3.3 are validated to apply it to the simulations on single-event effects in advanced microelectronic devices. The model calculations are compared with available experimental data of light-ion production (i.e., proton and alpha particle) from neutron-induced reactions on natSi and 16O, which are the major constituent elements of silicon semiconductor devices over the wide energy range. Comparisons of calculated and measured data for light-ion production indicate that the e-mode calculation with JENDL-3.3 provides better agreement with the experimental data below 20 MeV, and the QMD model reproduces them reasonably well at energies larger than 20 MeV.

本文言語英語
論文番号062004
ジャーナルJournal of Physics: Conference Series
312
SECTION 6
DOI
出版ステータス出版済み - 2011
イベントInternational Nuclear Physics Conference 2010, INPC2010 - Vancouver, BC, カナダ
継続期間: 7 4 20107 9 2010

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(全般)

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