Validation of nuclear reaction models relevant to cosmic-ray neutron induced single-event effects in microelectronics

Shin Ichiro Abe, Yukinobu Watanabe, Shusuke Hirayama, Nobuyuki Sano, Yoshiharu Tosaka, Masafumi Tsutsui, Hiroshi Furuta, Takeshi Imamura

研究成果: ジャーナルへの寄稿Conference article

7 引用 (Scopus)

抄録

The accuracy of nuclear reaction models used in the PHITS (Particle and Heavy Ion Transport code System) code, i.e., the INC model, the QMD model and the event generator mode (e-mode) with the evaluated nuclear data library JENDL-3.3 are validated to apply it to the simulations on single-event effects in advanced microelectronic devices. The model calculations are compared with available experimental data of light-ion production (i.e., proton and alpha particle) from neutron-induced reactions on natSi and 16O, which are the major constituent elements of silicon semiconductor devices over the wide energy range. Comparisons of calculated and measured data for light-ion production indicate that the e-mode calculation with JENDL-3.3 provides better agreement with the experimental data below 20 MeV, and the QMD model reproduces them reasonably well at energies larger than 20 MeV.

元の言語英語
記事番号062004
ジャーナルJournal of Physics: Conference Series
312
発行部数SECTION 6
DOI
出版物ステータス出版済み - 1 1 2011
イベントInternational Nuclear Physics Conference 2010, INPC2010 - Vancouver, BC, カナダ
継続期間: 7 4 20107 9 2010

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microelectronics
nuclear reactions
cosmic rays
neutrons
light ions
generators
semiconductor devices
alpha particles
heavy ions
protons
energy
silicon
ions
simulation

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

これを引用

Validation of nuclear reaction models relevant to cosmic-ray neutron induced single-event effects in microelectronics. / Abe, Shin Ichiro; Watanabe, Yukinobu; Hirayama, Shusuke; Sano, Nobuyuki; Tosaka, Yoshiharu; Tsutsui, Masafumi; Furuta, Hiroshi; Imamura, Takeshi.

:: Journal of Physics: Conference Series, 巻 312, 番号 SECTION 6, 062004, 01.01.2011.

研究成果: ジャーナルへの寄稿Conference article

Abe, Shin Ichiro ; Watanabe, Yukinobu ; Hirayama, Shusuke ; Sano, Nobuyuki ; Tosaka, Yoshiharu ; Tsutsui, Masafumi ; Furuta, Hiroshi ; Imamura, Takeshi. / Validation of nuclear reaction models relevant to cosmic-ray neutron induced single-event effects in microelectronics. :: Journal of Physics: Conference Series. 2011 ; 巻 312, 番号 SECTION 6.
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AU - Abe, Shin Ichiro

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AU - Hirayama, Shusuke

AU - Sano, Nobuyuki

AU - Tosaka, Yoshiharu

AU - Tsutsui, Masafumi

AU - Furuta, Hiroshi

AU - Imamura, Takeshi

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