TY - GEN
T1 - Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy
AU - Fukumoto, K.
AU - Yamada, Y.
AU - Matsuki, T.
AU - Onda, K.
AU - Noguchi, T.
AU - Mizokuchi, R.
AU - Oda, S.
AU - Koshihara, S.
PY - 2015
Y1 - 2015
N2 - We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.
AB - We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.
UR - http://www.scopus.com/inward/record.url?scp=84922152270&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84922152270&partnerID=8YFLogxK
U2 - 10.1007/978-3-319-13242-6_82
DO - 10.1007/978-3-319-13242-6_82
M3 - Conference contribution
AN - SCOPUS:84922152270
T3 - Springer Proceedings in Physics
SP - 337
EP - 340
BT - Ultrafast Phenomena XIX - Proceedings of the 19th International Conference
A2 - DiMauro, Louis
A2 - de Vivie-Riedle, Regina
A2 - Yamanouchi, Kaoru
A2 - Kuwata-Gonokami, Makoto
A2 - Cundiff, Steven
PB - Springer Science and Business Media, LLC
T2 - 19th International Conference on Ultrafast Phenomena, 2014
Y2 - 7 July 2014 through 11 July 2014
ER -