Void nucleation behavior of single-crystal high-purity iron specimens subjected to tensile deformation

Osamu Furukimi, Chatcharit Kiattisaksri, Yuji Takeda, Masatoshi Aramaki, Satoshi Oue, Shinji Munetoh, Masaki Tanaka

研究成果: ジャーナルへの寄稿記事

3 引用 (Scopus)

抄録

Void nucleation plays an important role for determining local deformation properties of ductile materials. In this study, the void nucleation behavior of single-crystal iron was examined in tensile tests. Two micrometer-size single crystals having a different type of slip extracted from electrodeposited pure iron were used to investigate the fracture mechanics during tensile deformation. Scanning electron microscopy (SEM) and high voltage electron microscopy (HVEM) images verified the existence of only a single slip system in the smaller specimen (cross-sectional area A = 16 µm2) and furthermore, no voids were observed. However, multiple slips and voids were observed in the larger specimen (A = 28 µm2). These findings allowed us to reveal that multiple slips are a necessary criterion for void nucleation in single-crystal iron.

元の言語英語
ページ(範囲)221-225
ページ数5
ジャーナルMaterials Science and Engineering A
701
DOI
出版物ステータス出版済み - 7 31 2017

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tensile deformation
voids
purity
Nucleation
Iron
Single crystals
nucleation
iron
slip
single crystals
Fracture mechanics
Electron microscopy
fracture mechanics
tensile tests
Scanning electron microscopy
Electric potential
micrometers
high voltages
electron microscopy
scanning electron microscopy

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

これを引用

Void nucleation behavior of single-crystal high-purity iron specimens subjected to tensile deformation. / Furukimi, Osamu; Kiattisaksri, Chatcharit; Takeda, Yuji; Aramaki, Masatoshi; Oue, Satoshi; Munetoh, Shinji; Tanaka, Masaki.

:: Materials Science and Engineering A, 巻 701, 31.07.2017, p. 221-225.

研究成果: ジャーナルへの寄稿記事

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AU - Oue, Satoshi

AU - Munetoh, Shinji

AU - Tanaka, Masaki

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