Vortex mobility in two-dimensional arrays of small Josephson junctions

C. D. Chen, P. Delsing, D. B. Haviland, Yuichi Harada, T. Claeson

研究成果: ジャーナルへの寄稿記事

1 引用 (Scopus)

抄録

We have measured the temperature and magnetic field dependencies of the zero bias resistance for several 2D arrays of small aluminum Josephson junctions. The normal state resistances RN of the junctions vary between 2.2 and 7.5 kω whereas the ratio of Josephson coupling energy EJ to the charging energy Ec ranges between 4.3 and 0.6, where Ec= e2 2C, C being the junction capacitance. The vortex mobility is deduced from the frustration (i.e. the number of flux quantum per unit cell) dependence of zero bias resistance. The mobility decreases when the temperature is lowered, resulting in a decrease of resistance. Fitting the data to a simple exponential form, we find the barrier for the vortex hopping to be -aEJ, with a≈0.3. For all arrays, there exists a crossover temperature Tcr which separates the regime of thermally assisted hopping from that of quantum creep of vortices. For our samples, Tcr is close to the theoretically predicted value of ωp 2π, where ωp=(8EJEc) 1 2.

元の言語英語
ページ(範囲)989-990
ページ数2
ジャーナルPhysica B: Physics of Condensed Matter
194-196
発行部数PART 1
DOI
出版物ステータス出版済み - 2 2 1994
外部発表Yes

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Josephson junctions
Vortex flow
vortices
Aluminum
Creep
Temperature distribution
Capacitance
frustration
Magnetic fields
Fluxes
charging
crossovers
Temperature
temperature distribution
capacitance
aluminum
temperature
energy
cells
magnetic fields

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

これを引用

Vortex mobility in two-dimensional arrays of small Josephson junctions. / Chen, C. D.; Delsing, P.; Haviland, D. B.; Harada, Yuichi; Claeson, T.

:: Physica B: Physics of Condensed Matter, 巻 194-196, 番号 PART 1, 02.02.1994, p. 989-990.

研究成果: ジャーナルへの寄稿記事

Chen, C. D. ; Delsing, P. ; Haviland, D. B. ; Harada, Yuichi ; Claeson, T. / Vortex mobility in two-dimensional arrays of small Josephson junctions. :: Physica B: Physics of Condensed Matter. 1994 ; 巻 194-196, 番号 PART 1. pp. 989-990.
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N2 - We have measured the temperature and magnetic field dependencies of the zero bias resistance for several 2D arrays of small aluminum Josephson junctions. The normal state resistances RN of the junctions vary between 2.2 and 7.5 kω whereas the ratio of Josephson coupling energy EJ to the charging energy Ec ranges between 4.3 and 0.6, where Ec= e2 2C, C being the junction capacitance. The vortex mobility is deduced from the frustration (i.e. the number of flux quantum per unit cell) dependence of zero bias resistance. The mobility decreases when the temperature is lowered, resulting in a decrease of resistance. Fitting the data to a simple exponential form, we find the barrier for the vortex hopping to be -aEJ, with a≈0.3. For all arrays, there exists a crossover temperature Tcr which separates the regime of thermally assisted hopping from that of quantum creep of vortices. For our samples, Tcr is close to the theoretically predicted value of ωp 2π, where ωp=(8EJEc) 1 2.

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