X-ray diffraction and scanning electron microscopic studies on the crystal structure and surface/interface morphology of zinc-octaethylporphyrin films on an indium tin oxide substrate spin coated with 3,4-polyethylenedioxythiophene: polystyrenesulfonate

S. Ryuzaki, J. Onoe

研究成果: Contribution to journalArticle査読

6 被引用数 (Scopus)

抄録

The crystal structure and surface/interface morphology of zinc-octaethylporphyrin [Zn(OEP)] films deposited on an indium tin oxide (ITO) substrate spin coated with 3,4- polyethylenedioxythiophene:polystyrenesulfonate (PEDOT:PSS) have been investigated using x-ray diffraction (XRD) and scanning electron microscope (SEM), respectively. XRD results indicated that there are two kinds of grains with their sizes of approximately 20 nm that is independent of film thickness and substrate temperature. One has a diffraction plane with an interplanar distance of 1.12 nm and with its orientation parallel to the substrate, whereas the other has a diffraction plane with an interplanar distance of 1.24 nm and with that inclined mainly by 60° to the substrate. The abundant ratio of the two grains was controlled to some extent by varying film thickness and substrate temperature. Cross-sectional SEM images showed that a part of Zn(OEP) molecules are incorporated into PEDOT:PSS for its film thickness smaller than 130 nm, while that Zn(OEP) whiskers begin to grow for its film thickness exceeding 130 nm.

本文言語英語
論文番号023526
ジャーナルJournal of Applied Physics
106
2
DOI
出版ステータス出版済み - 8 12 2009
外部発表はい

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(全般)

フィンガープリント

「X-ray diffraction and scanning electron microscopic studies on the crystal structure and surface/interface morphology of zinc-octaethylporphyrin films on an indium tin oxide substrate spin coated with 3,4-polyethylenedioxythiophene: polystyrenesulfonate」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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