X-ray micro-tomography using white beam radiation from SPring-8

M. Hoshino, K. Uesugi, T. Sera, N. Yagi

研究成果: Contribution to journalArticle査読

3 被引用数 (Scopus)

抄録

An X-ray micro-tomography system using white beam radiation was developed. A flat mirror was used to eliminate X-rays with energies higher than the critical energy of the mirror under the total reflection condition. To enlarge the field of view in the reflected beam, a simple mechanical bender was used to expand the beam in the vertical direction. A single tomographic dataset was obtained with the scanning time of 0.5sec using a fast rotational sample stage. The dominant X-ray energy which contributed to the image formation in the tomographic measurement was estimated from the linear absorption coefficient of the standard samples.

本文言語英語
論文番号P07018
ジャーナルJournal of Instrumentation
8
7
DOI
出版ステータス出版済み - 7 2013
外部発表はい

All Science Journal Classification (ASJC) codes

  • 数理物理学
  • 器械工学

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