TY - GEN
T1 - X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8
AU - Kimura, Shigeru
AU - Moritomo, Yutaka
AU - Tanaka, Yoshihito
AU - Tanaka, Hitoshi
AU - Toriumi, Koshiro
AU - Kato, Kenichi
AU - Yasuda, Nobuhiro
AU - Fukuyama, Yoshimitsu
AU - Kim, Jungeun
AU - Murayama, Haruno
AU - Takata, Masaki
PY - 2007/3/26
Y1 - 2007/3/26
N2 - The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, "x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.
AB - The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, "x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.
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UR - http://www.scopus.com/inward/citedby.url?scp=33947395991&partnerID=8YFLogxK
U2 - 10.1063/1.2436288
DO - 10.1063/1.2436288
M3 - Conference contribution
AN - SCOPUS:33947395991
SN - 0735403732
SN - 9780735403734
T3 - AIP Conference Proceedings
SP - 1238
EP - 1241
BT - SYNCHROTRON RADIATION INSTRUMENTATION
T2 - SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
Y2 - 28 May 2006 through 28 June 2006
ER -